Heidi Barnes at DesignCon 2017

Heidi Barnes will be speaking at several DesignCon sessions! If you want to learn from one of the industry’s leading experts, make sure you check her sessions out. We have included details of her classes down below. See you all at DesignCon!

Tutorial: 32 to 56 Gbps Serial Link Analysis and Optimization Methods for Pathological Channels
Ballroom D
Tuesday, January 31
1:30 pm — 4:30 pm

Abstract:
For many SerDes applications, when there is a channel that is proving difficult to achieve the required BER performance, the question of where and what to apply to the effort must be answered. The key focus of this tutorial is to unite a concerted channel analysis approach implementing both measurement hardware and EDA tools with contemporary SERDES internal tools (internal eye scan) for the purpose of optimizing BER for highly pathological channels (crosstalk, loss, return loss degradation, etc.,).

Panel Speakers:
Heidi Barnes — Applications Engineer, Keysight Technologies
Mike Resso — Signal Integrity Application Scientist, Keysight Technologies
Alfred Neves — Chief Technologist, Wild River Technology
Jack Carrel — Senior Staff Design Engineer, Xilinx

Panel: Briefing from the IEEE P370 Working Group: Electrical Characterization of PCBs and Related Interconnects at Frequencies up to 50 GHz
Ballroom G
Tuesday, January 31
4:45 pm — 6:00 pm

Abstract:
The IEEE P370 group is creating a proposed standard on best practices using de-embedding techniques to extract measurements of circuit board based interconnect structures to 50 GHz. The group is composed of industry and academia experts from around the world. Specific task groups are evaluating fixture design practices, verification of de-embedding algorithms and methods and quality metrics for the extracted S-parameter models. An overview and the latest status of the draft will be presented in this panel briefing.

Panel Speakers:
Dr. Eric Bogatin — Dean, Signal Integrity Academy, Teledyne LeCroy
Xiaoning Ye — Senior Member of Technical Staff, Intel
Kai Xiao — Senior Member of Technical Staff, Intel
Jun Fan — Professor, MST
Mikheil Tsiklauri — Professor, MST
Heidi Barnes — Senior Application Engineer, Keysight Technologies
Jason Ellison — Signal Integrity Engineer, The Siemon Company

Non-destructive Analysis and EM Model Tuning of PCB Signal Traces Using the Beatty Standard
Ballroom B
Wednesday, February 1
9:00 am — 9:45 am

Abstract:
In this presentation we will introduce different Beatty standard implementation flavors including single ended and differential series resonant structures. Measured results from the Beatty test structures can then be used to run a model optimization procedure that tunes for as-fabricated material properties to match with measured results. The significance of PCB test fixture de-embedding will also be addressed for accurate high frequency material properties. The end result of the paper is to provide a cookbook process for a PCB designer wishing to use and implement the Beatty standard on his next board turn.

Panel Speakers:
Heidi Barnes — Applications Engineer, Keysight Technologies
Jose Moreira — Senior Staff Engineer, Adventest
Manuel Walz — Engineer, Advantest

Signal Integrity & Power Integrity Engineering Design Techniques
Great America 1
Wednesday, February 1
10:15 am — 10:55 am

Abstract:
The USB Type-C Gen1 (5 Gbps) and Gen2 (10 Gbps) channels are some of the more challenging architectures for digital design engineers due to the extreme rise-time of transitions between zeros and ones. The small physical size of this high density reversible connector increases the risk that design engineers will encounter unforeseen interoperability issues due to the physical layer. These problems can be avoided by leveraging measurements and simulations to adequately debug and characterize the performance driving interconnect features and fabrication tolerances. There are also unexpected power integrity challenges with the new 100 Watts of power delivery that must be dealt with in a logical manner. This seminar will show a step-by-step process that can be implemented by signal integrity engineers to assure their success designing with a high speed serial bus.

Panel Speakers:
Heidi Barnes — Applications Engineer, Keysight Technologies
Mike Resso — Signal Integrity Application Scientist, Keysight Technologies

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